Sunday, April 19th, 2015



1.April 15, 2015 MSDG Meeting in Rockville (Joint Meeting with Washington Chromatography Discussion Group at USP); Speaker: Matthew C. Crowe, Ph.D.; The Dow Chemical Company; Topic: Multidimensional Liquid Separations Coupled to Electrospray Ionization Mass Spectrometry for the Analysis of Complex Polymers

2.2015 MSDG Young Investigator Travel Awards

3.Chromatography Forum of Delaware Valley (CFDV) Annual Short Course and Symposium: April 15-16, 2015; Analytical Separations Utilized in Biotechnology R&D

4.Short Course on Imaging Mass Spectrometry, Vanderbilt University, April 13-16, 2015

5.MS Imagery Analysis System for Medical Applications – A Strategic Workshop; June 5, 2015, Baltimore, MD

6.Mass Spectrometry in Biology and Medicine (MSBM) Summer School, Dubrovnik, Croatia, July 5-11, 2015

7.12th Symposium on the Practical Application of Mass Spectrometry in the Biotechnology Industry (Mass Spec 2015); Brooklyn, New York; September 22-25, 2015

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April 2015 MSDG Meeting

Speaker: Matthew C. Crowe, Ph.D.; The Dow Chemical Company

Topic: Multidimensional Liquid Separations Coupled to Electrospray Ionization Mass Spectrometry for the Analysis of Complex Polymers

Date: Wednesday, April 15, 2015

Time: 6:00 pm: Dinner and Social Hour; 7:00 pm: Presentation

Location: US Pharmacopeia, 12601 Twinbrook Parkway, Rockville, MD 20852
(directions to this location are found at

Dinner and Social Hour Please RSVP to Asher Newsome ( if you will be attending dinner.

Abstract: In an effort to comprehensively characterize the molecular structure of complex tetrapolymers up to 10,000 u, multidimensional separations coupled to electrospray ionization mass spectrometry (ESI/MS) were developed. Polymers composed of four different monomers were characterized to determine if performance differences could be correlated with differences in molecular structure. The polymers were analyzed with negative polarity ESI/MS, taking advantage of the presence of a permanent negative charge on one of the monomers. Direct infusion ESI/MS experiments did not provide full molecular weight coverage, so ultrahigh performance liquid chromatography (UHPLC) ESI/MS methods were developed which allowed separation of polymer components by molecular structure and the observation of a wider polymer molecular weight range with mass spectrometry. The UHPLC/ESI/MS results were dominated by low molecular weight polymer signals, making sample-to-sample comparisons difficult. To combat this, a size exclusion chromatography (SEC) fractionation technique was developed to separate polymer components by molecular weight prior to UHPLC/ESI/MS analysis. SEC fractionation followed by UHPLC/ELSD and UHPLC/ESI/MS of collected fractions was used to analyze complex tetrapolymers, increasing the mass range observable with ESI/MS over what was seen with direct infusion ESI/MS and UHPLC/ESI/MS. The results of these experiments will be presented, along with what was learned about the strengths and limitations of this analytical approach. Data analysis allowing statistical differentiation of complex polymer samples will also be discussed.

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March 2015 MSDG Meeting

Speaker: Greg Gillen, Ph.D.; NIST

Topic: Surface and Trace Chemical Analysis – Imaging Mass Spectrometry, Cluster Beams and Homeland Security

Date: Monday, March 16, 2015

Time: 6:15 pm: Dinner and Social Hour; 7:15 pm: Presentation

Location: Shimadzu Scientific Instrument, Inc. Training Center 7100 Riverwood Drive, Columbia, MD 21046 (Directions)

Dinner and Social Hour Please RSVP to Asher Newsome ( if you will be attending dinner.

Abstract: There is great interest in the continued development of cluster primary ion beams for applications in secondary ion mass spectrometry (SIMS). This interest is motivated by several unique aspects of the interaction between energetic cluster ions and surfaces. When a cluster ion strikes a surface, it dissociates into its constituents atoms. Each of the constituent atoms retains a fraction of the initial energy of the cluster ion. For example, a C60+ cluster ion with an impact energy of 3000 eV would dissociate after impacting the target surface into 60 carbon atoms each with an impact energy of only 50 eV. Since the depth resolution of a SIMS depth profile is directly related to the primary projectile energy, the use of a cluster ion provides a method for obtaining ultra-high resolution SIMS depth profiles. The dissociation of a cluster ion also leads to multiple individual primary particle impacts that are correlated both temporally and spatially. This results in a localized deposition of energy in the near-surface region of the sample leading to a several order of magnitude enhancement in the number of atoms or molecules desorbed from a surface by each cluster impact. Also, for some organic materials, the accumulation of primary beam-induced damage is minimized allowing stable characteristic molecular ion signals to be obtained at high primary ion doses (dynamic SIMS conditions). For some time we have been involved in an effort to develop the cluster primary beam SIMS capability on both magnetic sector and time-of-flight SIMS instruments. Several types of cluster ion sources are used for this project including; SF5+ , C8-, C60+ and Bi3+. Several years ago we began a pilot study to explore the potential use of cluster SIMS for examination of contraband materials (explosives and narcotics). These experiments led to the growth of a new research program focused on the chemical analysis of these contraband materials to support airport and military checkpoint security screening applications as well as forensics. This metrology and standards program has evolved to include the use of a variety of micro analytical tools including atmospheric pressure ionization mass spectrometry to study the chemical composition of trace contraband residues on various surfaces. Based on this information, optimized protocols and sampling materials have been developed for field collection of contraband residues. Experiments on aerodynamic based particle collection have provided new insights into trace sampling and have resulted in the construction of prototype systems for non contact trace detection of particles from various surfaces. This presentation will provide an overview of the development of surface mass spectrometry at NIST followed by a look “inside” the science of trace detection technology with an emphasis on measurement tools, standards and protocols we have developed in our laboratory to improve and optimize various detection technologies. Included in the presentation will be a discussion of the critical role of standards in homeland security and a description of the production of test articles containing explosives and narcotics that are fabricated using advanced materials deposition inkjet printer systems.

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